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Micro-Epsilon optimizes strip measurement for superconductor production
New optical precision measurement technology enables highly accurate real-time monitoring of sensitive superconducting strips during the slitting process.
www.micro-epsilon.com

The production of superconducting strips for advanced power applications requires maximum precision, high process stability and extremely material-friendly measurement technology. Micro-Epsilon addresses these requirements with the optoCONTROL 2700-40, an optical precision micrometer designed for non-contact real-time measurement of sensitive metal strips directly within the production process.
The solution was specifically developed for applications involving narrow stainless-steel strips coated with nickel alloys and sensitive PVD layers. In typical production processes, 12 mm wide strips are slit into several narrow segments measuring approximately 3 or 4 mm in width, separated by gaps of only 0.5 mm.
Non-contact measurement for sensitive coated materials
Because the processed materials are additionally coated with sensitive PVD layers, non-contact measurement technology provides a critical advantage. Mechanical stress, scratches and deformation of the sensitive nickel and coating layers are completely avoided, making the solution particularly suitable for highly precise superconductor manufacturing processes.
With the optoCONTROL 2700-40, the strip is measured directly after the slitting process while still moving through production. The complete 12 mm strip is captured within the measuring field of the optical micrometer.
Precise segment and gap measurement in real time
Thanks to the integrated “multi-segment” preset, the system can precisely measure both the total strip width and the width of each individual segment. Even the extremely narrow 0.5 mm gaps between segments are reliably detected and continuously monitored.
The measured values are transmitted to the machine controller in real time and can immediately be used for process regulation. This enables rapid detection of deviations and automatic adjustment of production parameters.
Nanometer resolution for ultra-precise manufacturing
Micro-Epsilon’s optical precision micrometers provide a resolution of 10 nanometers and repeatability of ≤ 0.1 µm. This allows even extremely narrow strip segments and minimal geometric deviations to be reliably detected. With a measuring rate of up to 5 kHz, the sensors also enable continuous monitoring of high-speed production processes.
According to Micro-Epsilon, continuous real-time measurement helps minimize scrap and significantly increases process reliability in demanding slitting and coating operations.
Flexible integration into industrial production systems
The optoCONTROL 2700-40 was designed for integration into modern industrial environments and supports various industrial communication interfaces. These include EtherCAT, PROFINET, Ethernet/IP and analog signal outputs.
As a result, the sensor solution can be flexibly integrated into existing slitting, coating and production systems.
Growing demand for precision measurement in superconductor manufacturing
Requirements for superconducting material production continue to increase, particularly in applications related to energy transmission, scientific research, medical technology and high-performance power systems. Because superconducting strips involve highly sensitive material structures and complex coatings, non-contact precision measurement systems are becoming increasingly important.
Manufacturers are increasingly adopting optical inline measurement technologies to monitor production quality, material utilization and process stability in real time.
Additional Context: industrial metrology and competitive benchmarking not included in the original announcement
In the high-precision industrial measurement market, Micro-Epsilon competes with companies including Keyence, Sick, Cognex, Omron and Panasonic Industry. Key competitive factors include measurement accuracy, speed, integration capabilities, robustness and the ability to perform non-contact quality inspection of sensitive materials.
Demand for high-resolution inline measurement systems continues to grow particularly in applications related to battery production, semiconductor manufacturing, precision coatings and superconductor technologies.
The solution presented by Micro-Epsilon is differentiated primarily through the combination of nanometer resolution, real-time process control, non-contact measurement and flexible industrial integration for ultra-precise manufacturing environments.
Edited by Maria Brueva, Induportals editor – adapted by AI.
www.micro-epsilon.com

